Patel, K. V. and Parmar, H. C. and Patel, H. P. and More, V. B. and Kundaria, Vishal B. and Patel, B. N. (2021) Study about GAU 4: A New High Yielding Ymv Resistant Urdbean Variety. International Journal of Plant & Soil Science, 33 (17). pp. 227-235. ISSN 2320-7035
1388-Article Text-2593-1-10-20221011.pdf - Published Version
Download (897kB)
Abstract
GAU 4 is a high yielding, YMVD resistance variety developed through selection from germplasm maintained (GP No. 6) at ARS, AAU, Jabugam, Dist : Chotta Udaipur, Gujarat and tested as JAUG 2 in trial. JAUG 2 recorded 21.03 and 24.48 per cent higher yield (961 kg/ha) over the checks T 9 and GU 1, respectively under middle Gujarat. In kharif season, JAUG 2 recorded 1005 kg/ha seed yield which was 19.08 and 23.92 per cent higher over T 9 and GU 1, respectively under middle Gujarat. In summer, JAUG 2 recorded 864 kg/ha seed yield which was 22.21 and 23.42 per cent higher over T 9 and GU 1, respectively under middle Gujarat. The proposed genotype JAUG 2 has semi-erect plant type and medium maturity duration. It has deltoid leaf shape, green hairy pod with 5-7 seeds per pod, dark black and medium seed size (seed index.:4-5 g). On quality point of view, this genotype contains 24.66% protein, 55.58% total carbohydrate, 4.77% total soluble sugar, 0.946% phenol and 8.89 mg/100g flavonoid, which is comparable to check varieties T 9 and GU 1. In mineral contains 49.97 Fe, 29.28 Zn and 7.29 Cu mg kg-1 which is higher than both check varieties viz., T 9 and GU1. The genotype JAUG 2 is found resistant to Yellow Mosaic Disease under natural field condition as compared to check T 9 and GU 1. The special feature of newly develop variety is medium maturity, semi-erect plant type, hairy pod, dark black, drum shape seed, resistant to YMD with higher yield.
Item Type: | Article |
---|---|
Subjects: | Pustakas > Agricultural and Food Science |
Depositing User: | Unnamed user with email support@pustakas.com |
Date Deposited: | 30 Jan 2023 11:13 |
Last Modified: | 02 Jan 2024 13:17 |
URI: | http://archive.pcbmb.org/id/eprint/40 |